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HORIBA Scientific, global leader in spectroscopic analysis for over 40 years, is proud to announce the new HORIBA CLUE Series detectors for Scanning Electron Microscopes (SEM).

author/source: HORIBA Scienfic

HORIBA CLUE Series offer a scalable platform for imaging and spectroscopic analysis of nano-objects with SEM and dual SEM/FIB (Focused Ion Beam) microscopes.

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