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Horiba Scientific Introduces New Clue Series Detectors for Scanning Electron Microscopes

LabBulletin publication date: Oct 31, 2017
author/source: HORIBA Scientific

HORIBA CLUE Series offer a scalable platform for imaging and spectroscopic analysis of nano-objects with SEM and dual SEM/FIB (Focused Ion Beam) microscopes.

HORIBA Scientific, global leader in spectroscopic analysis for over 40 years, is proud to announce the new HORIBA CLUE Series detectors for Scanning Electron Microscopes (SEM).

 

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