News & Events

The Voice of Measurement and Testing

Horiba Scientific Introduces New Clue Series Detectors for Scanning Electron Microscopes

LabBulletin publication date: Oct 31, 2017
author/source: HORIBA Scientific

HORIBA CLUE Series offer a scalable platform for imaging and spectroscopic analysis of nano-objects with SEM and dual SEM/FIB (Focused Ion Beam) microscopes.

HORIBA Scientific, global leader in spectroscopic analysis for over 40 years, is proud to announce the new HORIBA CLUE Series detectors for Scanning Electron Microscopes (SEM).


Read full article

You need to be a member to use this resource

We are sorry but you need to be a member to continue reading or download linked content from this resource.

Please click here to find out more about joining the BMTA.