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CIM2025 – the growing influence of AI in metrology

SYNTHESIS REPORT CIM25

The 22nd International Metrology Congress (CIM2025) took place this March at Eurexpo Lyon, celebrating 150 years since the signing of the Metre Convention

Organised by the Collège Français de Métrologie (CFM), the event was held alongside Global Industrie-France’s largest industrial trade show. 

The four-day event attracted more than 600 participants from 45 countries, representing a diverse mix of metrologists, engineers, R&D professionals, and decision-makers from national metrology institutes, industry and academia. The event featured a packed programme featuring more than 200 presentations, 18 technical sessions, five roundtable discussions and two dedicated poster sessions. 

One central theme of this year’s congress was the digitalisation of measurement and the growing influence of AI in metrology. Experts explored how digital technologies and big data are transforming the way measurements are made, managed, and trusted, with significant implications for quality, safety and innovation across all sectors. 

Sustainability was also high on the agenda, with sessions examining how measurement science can help address environmental challenges, from monitoring emerging pollutants to supporting the transition to greener manufacturing practices. The congress also looked ahead to the future of quality infrastructure in a data-driven world and considered the evolving role of metrologists as the landscape continues to change.

This year, CIM2025 introduced two notable additions to its programme. The QI-Digital workshop looked into the digital transformation of quality infrastructure and a new short course on ISO/IEC 17025 provided practical guidance on measurement traceability for accredited laboratories.