The NPL is hosting a Make, Monitor, Measure: Getting the Best Out of Your Data event at the 3M Buckley Innovation Centre in Huddersfield on Wednesday 5 November.
Hosted by the NPL as part of its 125-year celebrations, the three-hour event (1-4pm) explores how data science and metrology can help transform machine data into manufacturing success.
Attendees will hear from leading NPL experts who will share practical methods to improve data quality, process reliability and decision-making. Topics include predictive quality control, sensor accuracy, and digital tools for more resilient supply chains.
Speakers include:
- Dan Povey on the impact of sensor quality in predictive analysis
- Dave Gorman on using synthetic data for deep learning classification
- David Whittaker on applying machine learning to sound and vibration data
- Joao Gregorio on data quality for manufacturing
- Liam Wright on the growing importance of metrology in the chemical industry
- Louise Wright on digital engineering at NPL
- Moulham Alsuleman on knowledge engineering for pharmaceutical manufacturing
Visitors can expect hands-on demonstrations, case studies, lab tours and plenty of opportunities to network with NPL scientists, industry peers and support organisations. The session will also highlight funding routes such as the Measurement for Business (M4B) programme, designed to help SMEs implement digital and measurement solutions.
Book a place here
